The global push for automation, smart infrastructure, and advanced healthcare demands increasingly sophisticated sensory capabilities. Industries face pressure to reduce operational costs while enhancing precision and reliability. This technology aligns with these trends by offering a path to more robust, energy-efficient, and compact imaging solutions, critical for navigating the complexities of modern industrial and consumer applications.
Enables ultra-high sensitivity and low-noise imaging by optimally controlling avalanche multiplication, efficiently detecting weak light signals for clear images in low-light conditions.
Achieves low-voltage operation and high reliability by generating a uniform, high electric field within the device's breakdown voltage, reducing stress and ensuring long-term stable performance.
Supports ultra-compact, high-density integration by miniaturizing electrode width and spacing to under 10nm and optimizing electrode shape, enabling smaller, higher-performance devices.
This patent protects a solid-state imaging device featuring a specific photoconversion film stacked structure, defined by electrode width and spacing below 10nm, and an optimized electrode corner curvature radius (0.6 ≤ radius/thickness ≤ 1.0). The claims ensure high electric field uniformity for avalanche multiplication at low applied voltages, offering robust protection for its core design.
This patent focuses on the core device structure and electrode design for avalanche multiplication. White space exists in integrating this sensor into specific system-on-chip (SoC) architectures, developing advanced image processing algorithms, or exploring novel packaging solutions for extreme environments.
This technology's high sensitivity and improved signal-to-noise ratio could significantly reduce power consumption and replacement frequency for high-output lighting in industrial inspection lines. For example, annual lighting electricity costs of ~$200K (AI est.) could be reduced by 50% (~$100K (AI est.)), and equipment replacement costs of ~$50K (AI est.) could be reduced by 80% (~$50K (AI est.)) due to extended lifespan. Additionally, improved defect detection could avoid ~$650K (AI est.) in annual losses from yield improvements, totaling an estimated ~$800K (AI est.) in annual economic benefits.
X: High Sensitivity & Low Noise Performance
Y: Low Voltage & Power Efficiency