The accelerating pace of innovation in consumer electronics, automotive, and medical devices demands ever-smaller, more powerful components. This trend is pushing the limits of current manufacturing capabilities, particularly in deposition and patterning. Companies are seeking solutions that not only enhance precision but also reduce waste and improve throughput to meet escalating market demand and maintain profitability in a highly competitive landscape. This patent offers a pathway to achieve these critical objectives.
Improves deposition accuracy by up to 30% compared to conventional single-mask methods.
Establishes strong market differentiation with only 3 prior art references, indicating high technical uniqueness.
Simplifies complex multi-layer deposition processes, significantly reducing defect rates and improving overall production yield.
This patent protects a novel mask set and sequential deposition method, covering a broad technical scope with 15 claims. Its swift grant (approximately 5 months from request to allowance) and limited prior art references (only 3) suggest high patentability and a robust, difficult-to-invalidate claim set.
This patent focuses on the mask set and sequential deposition method. Licensees could develop novel deposition materials, advanced automation for mask alignment, or integrated post-deposition inspection systems to create complementary IP.
Reducing the defect rate in semiconductor manufacturing from 5% to 2% (a 3% improvement) could lead to an annual cost reduction of ~$1.0M (AI est.). This is based on a monthly production of 10,000 units with a manufacturing cost of ~$330/unit (AI est.), directly impacting material, rework, and disposal costs.
X: Deposition Accuracy and Yield
Y: Development Time Reduction and Market Competitiveness